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DIN EN 62979 VDE 0126-45:2018-09

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DIN EN 62979 VDE 0126-45:2018-09

Photovoltaic module - Bypass diode - Thermal runaway test (IEC 62979:2017); German version EN 62979:2017

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This international standard provides a method for evaluating whether a bypass diode (BD) as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating.

Author VDE
Editor VDE
Document type Standard
Format Paper
ICS 27.160 : Solar energy engineering
Number of pages 17
Replace DIN EN 62979 (2016-04)
Cross references EN 62979 (2017-10), IDT
Weight(kg.) 0.1289
Year 2018
Document history DIN EN 62979 (2018-09)
Country Germany
Keyword EN 62979;62979